Mateck Sapphire Aluminium oxide Substrate, Al 2 O 3

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Mateck Sapphire Aluminium oxide Substrate, Al₂O₃
Categories:	Ceramic; Oxide; Aluminum Oxide
Material Notes:	Substrate single crystals for superconductivity.
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Physical Properties	Metric	English	Comments

Density	3.98 g/cc	0.144 lb/in³
a Lattice Constant	4.77 Å	4.77 Å
c Lattice Constant	13.04 Å	13.04 Å

Electrical Properties	Metric	English	Comments
Dielectric Constant	9.0	9.0	parallel c-axis
	11.5	11.5	perpendicular c-axis
Dielectric Loss Index	0.000030 @Frequency 1e+10 Hz	0.000030 @Frequency 1e+10 Hz	parallel C-axis
	0.000086 @Frequency 1e+10 Hz	0.000086 @Frequency 1e+10 Hz	perpendicular C-axis

Thermal Properties	Metric	English	Comments
CTE, linear	5.00 µm/m-°C	2.78 µin/in-°F	perpendicular C-axis
	6.70 µm/m-°C	3.72 µin/in-°F	parallel C-axis
Melting Point	2040 °C	3700 °F

Descriptive Properties
Flatness (µm/10mm), max	0.3
Growth Techniques	Czochralski
Orientation	(0001), (1-102), (11-20)
Orientation Accuracy ( ° ), Max	0.5
Parallelness ( ° ), max	0.3
Polishing	one side or both sides epi-polished
Production Method	Czochralski, HEM, Verneuil
Roughness of surface (angstroms), max	10
Scratches	none
Standard Size (mm)	10 x 10 x 1 or 0.5
State	monocrystalline
Structure	hexagonal
Surface Quality	with light microscope without defects
Tolerance of Length (mm)	± 0.02
Tolerance of Thickness (mm)	± 0.02

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CMAT001 / 87685

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