Oxygen-free Electronic Copper (OFE), UNS C10100, H80 (35%), rod (25 mm Diameter)

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Oxygen-free Electronic Copper (OFE), UNS C10100, H80 (35%), rod (25 mm Diameter)
Categories:	Metal; Nonferrous Metal; Copper Alloy; Wrought Copper
Material Notes:	Test specimen: rod, 25mm diam. Applications: busbars, bus conductors, waveguides, hollow conductors, lead-in wires and anodes for vacuum tubes, vacuum seals, transistor components, glass-to-metal seals, coaxial cables, klystrons, microwave tubes, and rectifiers. Processing: Excellent hot and cold workability; good forgeability. Fabricated by bending, coining, coppersmithing, drawing and upsetting, hot forging and pressing, knurling, roll threading, shearing, spinning, swaging, and stamping. Corrosion Resistance: Good to excellent. Susceptible to galvanic corrosion when coupled with iron, aluminum, magnesium, lead, tin, and zinc. Good resistance to atmospheric, brackish water, sea water, and non-oxidizing acid corrosion, but avoid heating in oxidizing atmospheres or exposing to oxidizing acids, moist halogens, sulfides, ammonia, or solutions with ammonium ions. UNS C10100 - ASTM B12, B49,B133, B187, F 68; 101A (Australia); C110 (UK); CDA 101 OFE; ISO Cu-OFE; JIS C1011 H3510 (Japan); QQ-C-502
Key Words:	ASTM B12, B49, B133, B187, F68, AS 101A 1567 (Australia), Cu/cl NF A53301 (France), ISO Cu-OFE, CEN CW009A, oxygen-free high conductivity copper (OFHC), JIS C1011 H3510, QQ-C-502, CDA 101 OFE
Vendors:

Available Properties

Density
Hardness, Rockwell B
Hardness, Rockwell F
Tensile Strength, Ultimate
Tensile Strength, Yield
Elongation at Break, in 50 mm (2 in), 55% reduction in area
Reduction of Area
Modulus of Elasticity
Poissons Ratio
Fatigue Strength
Machinability, UNS C36000 (free-cutting brass) = 100%
Forgeability, UNS C37700 (forging brass) = 100%
Shear Modulus
Shear Strength
Electrical Resistivity
CTE, linear
CTE, linear
CTE, linear
Specific Heat Capacity
Thermal Conductivity
Melting Point
Annealing Point
Annealing Temperature
Hot-Working Temperature
Copper, Cu

Property Data

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